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Hard X-Ray Angle Resolved Photoemission

Angle resolved Photoemission is a powerful tool to investigate the elecronic properties of materials. The technique is, due to the low photon energy used, surface sensitive. A possible route to overcome this and gain information not about the surface but about the bulk electronic structure, is the use of harder X-Rays that allow to look deeper into the bulk of the materials studied.

First results on a tungsten crystal, measured with Mg Ka radiation, are shown below. Also shown is a comparison to theory from the group of J. Minar, J. Braun and H. Ebert of the Institute of Physical Chemistry at the Ludwig-Maximilians-Universität, Munich.

the work shown here is published in C. Papp et al. Phys. Rev. B 84 (2011) 045433 or our contribution A. Gray et al. Nature Materials 10 (2011) 759.